Analysis of diffraction image data collected using the rotation method.

• The rotation method.
• Orientation refinement and reflection integration.
  • Orientational refinement.
  • Integrated intensities by profile fitting.
  • Lorentz-Polarisation corrections.
• Image scaling and merging.
• Scaling of data from different wavelengths.
• Calculation of phases.
• Phase improvement and density modification.
• Quality of electron density maps.
• Model refinement.